TEST_NAME : Wafer
TEST_DATE : 24_09_05-14_31_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-012-025-05 | FUSED_ID : 6359364768394953109
  IC_TEMP :  -51.33 | VDDM : 1123.96 | AUX_INT :  -15.62 | CsaBias :   67.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32418e-03 / 2
  ADC_P0  : -1.56176e-02 ± 2.51857e-02
  ADC_P1  : 8.35325e-03 ± 6.27138e-04
  ADC_P2  : -4.73208e-06 ± 3.10735e-06
  CSA_Chi2/NDF : 1.68388e-04 / 2
  CSA_P0  : 5.99267e-02 ± 8.65521e-03
  CSA_P1  : 1.03163e-02 ± 6.52108e-04
  CSA_P2  : -5.29233e-05 ± 9.93083e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [34, 44, 51, 80]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [44, 71, 75, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1824', '1.800', '0.1556', '1.799', '0.0835', '7.000', '0.7083', 1, 1, 1, 1, 1725539480.5305996]
VI_after__Init : ['1.202', '0.1822', '1.800', '0.1555', '1.800', '0.0761', '7.000', '0.7076', 1, 1, 1, 1, 1725539489.3318827]
VI_at__the_End : ['1.202', '0.4973', '1.800', '0.1378', '1.799', '0.1123', '7.000', '0.7083', 1, 1, 1, 1, 1725539557.2202566]