TEST_NAME : Wafer
TEST_DATE : 24_09_05-15_09_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-013-005-15 | FUSED_ID : 6359364768394956895
  IC_TEMP :  -53.42 | VDDM : 1124.53 | AUX_INT :   -9.65 | CsaBias :   76.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.40590e-03 / 2
  ADC_P0  : -9.64899e-03 ± 2.53924e-02
  ADC_P1  : 8.63867e-03 ± 6.34883e-04
  ADC_P2  : -6.28003e-06 ± 3.16564e-06
  CSA_Chi2/NDF : 1.76098e-04 / 2
  CSA_P0  : 5.93115e-02 ± 8.85115e-03
  CSA_P1  : 1.02198e-02 ± 6.66870e-04
  CSA_P2  : -4.92522e-05 ± 1.01556e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [16, 26, 66, 78, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [4, 14, 20, 99, 112, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1085', '1.800', '0.1750', '1.800', '0.0802', '7.000', '0.7076', 1, 1, 1, 1, 1725541794.8287535]
VI_after__Init : ['1.202', '0.1084', '1.800', '0.1750', '1.800', '0.0744', '7.000', '0.7075', 1, 1, 1, 1, 1725541802.9520876]
VI_at__the_End : ['1.202', '0.5030', '1.800', '0.1408', '1.804', '0.1101', '7.000', '0.7087', 1, 1, 1, 1, 1725541864.0444055]