TEST_NAME : Wafer
TEST_DATE : 24_09_05-15_06_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-013-007-15 | FUSED_ID : 6359364768394956927
  IC_TEMP :  -50.11 | VDDM : 1111.65 | AUX_INT :   -5.93 | CsaBias :   70.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.48213e-04 / 2
  ADC_P0  : -5.92886e-03 ± 1.97019e-02
  ADC_P1  : 8.58810e-03 ± 4.99109e-04
  ADC_P2  : -6.07347e-06 ± 2.50009e-06
  CSA_Chi2/NDF : 1.19707e-04 / 2
  CSA_P0  : 5.94011e-02 ± 7.29764e-03
  CSA_P1  : 1.00402e-02 ± 5.49825e-04
  CSA_P2  : -4.71075e-05 ± 8.37318e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [40, 82, 85, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [37, 74, 81, 84, 87, 102, 109, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3620', '1.800', '0.1596', '1.800', '0.0907', '7.000', '0.7075', 1, 1, 1, 1, 1725541601.190849]
VI_after__Init : ['1.201', '0.3619', '1.800', '0.1596', '1.800', '0.0855', '7.000', '0.7075', 1, 1, 1, 1, 1725541609.219217]
VI_at__the_End : ['1.202', '0.4990', '1.800', '0.1407', '1.804', '0.1095', '7.000', '0.7084', 1, 1, 1, 1, 1725541677.809917]