TEST_NAME : Wafer
TEST_DATE : 24_09_05-15_05_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-013-008-15 | FUSED_ID : 6359364768394956943
  IC_TEMP :  -47.65 | VDDM : 1130.90 | AUX_INT :   -7.27 | CsaBias :   83.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32418e-03 / 2
  ADC_P0  : -7.26913e-03 ± 2.47277e-02
  ADC_P1  : 8.34379e-03 ± 6.21150e-04
  ADC_P2  : -4.73208e-06 ± 3.10735e-06
  CSA_Chi2/NDF : 1.31883e-04 / 2
  CSA_P0  : 5.97671e-02 ± 7.65980e-03
  CSA_P1  : 1.02652e-02 ± 5.77111e-04
  CSA_P2  : -5.02051e-05 ± 8.78871e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [82]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [48, 53, 54, 55, 59, 62, 73, 91, 97, 99, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4386', '1.800', '0.1656', '1.800', '0.0940', '7.000', '0.7085', 1, 1, 1, 1, 1725541504.0954876]
VI_after__Init : ['1.202', '0.4386', '1.800', '0.1657', '1.800', '0.0864', '7.000', '0.7076', 1, 1, 1, 1, 1725541512.8247678]
VI_at__the_End : ['1.202', '0.5042', '1.800', '0.1418', '1.800', '0.1108', '7.000', '0.7083', 1, 1, 1, 1, 1725541579.7235534]