TEST_NAME : Wafer
TEST_DATE : 24_09_05-14_50_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x5 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-013-017-08 | FUSED_ID : 6359364768394957080
  IC_TEMP :  -52.93 | VDDM : 1127.69 | AUX_INT :   -8.41 | CsaBias :   67.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20159e-03 / 2
  ADC_P0  : -8.41454e-03 ± 2.35109e-02
  ADC_P1  : 8.53376e-03 ± 5.94465e-04
  ADC_P2  : -5.47737e-06 ± 2.99299e-06
  CSA_Chi2/NDF : 1.35142e-04 / 2
  CSA_P0  : 6.15703e-02 ± 7.75384e-03
  CSA_P1  : 1.02112e-02 ± 5.84196e-04
  CSA_P2  : -4.99306e-05 ± 8.89661e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [30, 83, 97, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [6, 26, 48]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3442', '1.800', '0.1645', '1.800', '0.0911', '7.000', '0.7065', 1, 1, 1, 1, 1725540639.452881]
VI_after__Init : ['1.202', '0.3443', '1.800', '0.1645', '1.800', '0.0853', '7.000', '0.7069', 1, 1, 1, 1, 1725540648.2731895]
VI_at__the_End : ['1.202', '0.5032', '1.800', '0.1404', '1.803', '0.1118', '7.000', '0.7078', 1, 1, 1, 1, 1725540715.4209998]