TEST_NAME : Wafer
TEST_DATE : 24_09_05-14_49_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-013-018-08 | FUSED_ID : 6359364768394957096
  IC_TEMP :  -50.66 | VDDM : 1135.94 | AUX_INT :  -43.85 | CsaBias :   51.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43034e-03 / 2
  ADC_P0  : -4.38453e-02 ± 2.75154e-02
  ADC_P1  : 8.74487e-03 ± 6.55205e-04
  ADC_P2  : -7.31183e-06 ± 3.07826e-06
  CSA_Chi2/NDF : 9.61741e-05 / 2
  CSA_P0  : 5.93414e-02 ± 6.54111e-03
  CSA_P1  : 9.28115e-03 ± 4.92825e-04
  CSA_P2  : -3.94558e-05 ± 7.50515e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [49, 74, 107, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [43, 59, 62, 78]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1882', '1.800', '0.1422', '1.799', '0.0915', '7.000', '0.7067', 1, 1, 1, 1, 1725540543.565336]
VI_after__Init : ['1.202', '0.1881', '1.800', '0.1421', '1.800', '0.0859', '7.000', '0.7069', 1, 1, 1, 1, 1725540551.667717]
VI_at__the_End : ['1.202', '0.4882', '1.800', '0.1379', '1.800', '0.1116', '7.000', '0.7073', 1, 1, 1, 1, 1725540619.4583778]