TEST_NAME : Wafer
TEST_DATE : 24_09_05-14_39_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-013-024-08 | FUSED_ID : 6359364768394957192
  IC_TEMP :  -48.87 | VDDM : 1133.95 | AUX_INT :   -6.52 | CsaBias :   67.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00677e-03 / 2
  ADC_P0  : -6.52201e-03 ± 2.14832e-02
  ADC_P1  : 8.31826e-03 ± 5.26625e-04
  ADC_P2  : -5.64838e-06 ± 2.55622e-06
  CSA_Chi2/NDF : 8.97230e-05 / 2
  CSA_P0  : 6.02458e-02 ± 6.31792e-03
  CSA_P1  : 9.90471e-03 ± 4.76010e-04
  CSA_P2  : -4.29336e-05 ± 7.24907e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [20, 62, 70, 78, 84, 107, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [0, 3, 4, 7, 39, 64, 90]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3035', '1.800', '0.1516', '1.799', '0.0848', '7.000', '0.7072', 1, 1, 1, 1, 1725539964.0927083]
VI_after__Init : ['1.202', '0.3037', '1.800', '0.1516', '1.800', '0.0790', '7.000', '0.7071', 1, 1, 1, 1, 1725539972.2151318]
VI_at__the_End : ['1.202', '0.5099', '1.800', '0.1377', '1.799', '0.1089', '7.000', '0.7082', 1, 1, 1, 1, 1725540031.4564223]