TEST_NAME : Wafer
TEST_DATE : 24_09_05-14_36_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-013-026-08 | FUSED_ID : 6359364768394957224
  IC_TEMP :  -56.57 | VDDM : 1189.56 | AUX_INT : -648.82 | CsaBias : -435.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27565e-02 / 2
  ADC_P0  : -6.48816e-01 ± 1.87988e-01
  ADC_P1  : 1.82284e-02 ± 3.79774e-03
  ADC_P2  : -4.06075e-05 ± 1.54687e-05
  CSA_Chi2/NDF : 6.97605e-05 / 2
  CSA_P0  : 6.13974e-02 ± 5.57092e-03
  CSA_P1  : 9.31632e-03 ± 4.19729e-04
  CSA_P2  : -3.55994e-05 ± 6.39197e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [9, 16, 34, 62, 108, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [8, 25, 32, 44, 48, 61, 69, 71, 85, 91, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2339', '1.800', '0.1262', '1.800', '0.0860', '7.000', '0.7074', 1, 1, 1, 1, 1725539770.4371681]
VI_after__Init : ['1.202', '0.2340', '1.800', '0.1262', '1.800', '0.0803', '7.000', '0.7073', 1, 1, 1, 1, 1725539779.4664645]
VI_at__the_End : ['1.202', '0.5050', '1.800', '0.1344', '1.804', '0.1089', '7.000', '0.7080', 1, 1, 1, 1, 1725539839.7735262]