TEST_NAME : Wafer
TEST_DATE : 24_09_05-15_17_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-014-005-01 | FUSED_ID : 6359364768394960977
  IC_TEMP :  -50.85 | VDDM : 1129.57 | AUX_INT :   -8.02 | CsaBias :   85.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.29143e-03 / 2
  ADC_P0  : -8.01660e-03 ± 2.43511e-02
  ADC_P1  : 8.58049e-03 ± 6.09593e-04
  ADC_P2  : -6.34687e-06 ± 3.01673e-06
  CSA_Chi2/NDF : 1.32949e-04 / 2
  CSA_P0  : 5.94024e-02 ± 7.69068e-03
  CSA_P1  : 1.01870e-02 ± 5.79437e-04
  CSA_P2  : -4.72448e-05 ± 8.82414e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [42, 50]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [27, 40, 43, 50, 63, 83, 86, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2481', '1.800', '0.1537', '1.799', '0.0878', '7.000', '0.7086', 1, 1, 1, 1, 1725542277.4252467]
VI_after__Init : ['1.202', '0.2481', '1.800', '0.1536', '1.800', '0.0807', '7.000', '0.7076', 1, 1, 1, 1, 1725542285.709646]
VI_at__the_End : ['1.202', '0.5088', '1.800', '0.1387', '1.801', '0.1086', '7.000', '0.7083', 1, 1, 1, 1, 1725542348.7427373]