TEST_NAME : Wafer
TEST_DATE : 24_09_05-15_24_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-014-009-01 | FUSED_ID : 6359364768394961041
  IC_TEMP :  -51.74 | VDDM : 1111.30 | AUX_INT :   -6.53 | CsaBias :   82.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02532e-03 / 2
  ADC_P0  : -6.53233e-03 ± 2.16664e-02
  ADC_P1  : 8.18784e-03 ± 5.18769e-04
  ADC_P2  : -5.76311e-06 ± 2.45502e-06
  CSA_Chi2/NDF : 8.34155e-05 / 2
  CSA_P0  : 6.20661e-02 ± 6.09180e-03
  CSA_P1  : 9.33954e-03 ± 4.58973e-04
  CSA_P2  : -3.79079e-05 ± 6.98962e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [26, 50, 113, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [54, 75, 108, 113, 116, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3599', '1.800', '0.1905', '1.800', '0.0924', '7.000', '0.7072', 1, 1, 1, 1, 1725542665.1861343]
VI_after__Init : ['1.202', '0.3598', '1.800', '0.1905', '1.800', '0.0870', '7.000', '0.7076', 1, 1, 1, 1, 1725542673.366423]
VI_at__the_End : ['1.202', '0.4958', '1.800', '0.1392', '1.803', '0.1118', '7.000', '0.7079', 1, 1, 1, 1, 1725542733.1947558]