TEST_NAME : Wafer
TEST_DATE : 24_09_05-15_27_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-014-011-01 | FUSED_ID : 6359364768394961073
  IC_TEMP :  -49.14 | VDDM : 1133.20 | AUX_INT :   -6.58 | CsaBias :   80.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.69146e-04 / 2
  ADC_P0  : -6.57793e-03 ± 2.10859e-02
  ADC_P1  : 7.97179e-03 ± 5.00636e-04
  ADC_P2  : -4.79740e-06 ± 2.35929e-06
  CSA_Chi2/NDF : 7.79164e-05 / 2
  CSA_P0  : 5.90839e-02 ± 5.88758e-03
  CSA_P1  : 9.42409e-03 ± 4.43587e-04
  CSA_P2  : -3.80445e-05 ± 6.75530e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [59, 69, 75, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [7, 9, 55, 60, 68, 69, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2334', '1.800', '0.1631', '1.800', '0.0840', '7.000', '0.7072', 1, 1, 1, 1, 1725542858.1950877]
VI_after__Init : ['1.202', '0.2334', '1.800', '0.1630', '1.800', '0.0786', '7.000', '0.7070', 1, 1, 1, 1, 1725542866.2064848]
VI_at__the_End : ['1.202', '0.4987', '1.800', '0.1388', '1.804', '0.1104', '7.000', '0.7079', 1, 1, 1, 1, 1725542929.911536]