TEST_NAME : Wafer
TEST_DATE : 24_09_05-15_29_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-014-012-01 | FUSED_ID : 6359364768394961089
  IC_TEMP :  -49.18 | VDDM : 1130.57 | AUX_INT :   -7.10 | CsaBias :   81.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49882e-03 / 2
  ADC_P0  : -7.09697e-03 ± 2.63366e-02
  ADC_P1  : 8.05741e-03 ± 6.41619e-04
  ADC_P2  : -4.35053e-06 ± 3.10734e-06
  CSA_Chi2/NDF : 9.75549e-05 / 2
  CSA_P0  : 6.15327e-02 ± 6.58790e-03
  CSA_P1  : 9.79314e-03 ± 4.96351e-04
  CSA_P2  : -4.32904e-05 ± 7.55883e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [20, 54, 103, 107, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [14, 79, 113, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3569', '1.800', '0.1782', '1.799', '0.0950', '7.000', '0.7072', 1, 1, 1, 1, 1725542954.8886175]
VI_after__Init : ['1.202', '0.3570', '1.800', '0.1783', '1.800', '0.0893', '7.000', '0.7073', 1, 1, 1, 1, 1725542963.0470095]
VI_at__the_End : ['1.202', '0.5026', '1.800', '0.1387', '1.800', '0.1115', '7.000', '0.7077', 1, 1, 1, 1, 1725543023.6602302]