TEST_NAME : Wafer
TEST_DATE : 24_09_05-15_30_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-014-013-01 | FUSED_ID : 6359364768394961105
  IC_TEMP :  -50.31 | VDDM : 1142.10 | AUX_INT :   -6.37 | CsaBias :   75.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.94417e-04 / 2
  ADC_P0  : -6.36787e-03 ± 1.77958e-02
  ADC_P1  : 8.23352e-03 ± 4.29610e-04
  ADC_P2  : -5.84989e-06 ± 2.04556e-06
  CSA_Chi2/NDF : 8.16491e-05 / 2
  CSA_P0  : 6.07156e-02 ± 6.02696e-03
  CSA_P1  : 9.87237e-03 ± 4.54088e-04
  CSA_P2  : -4.30538e-05 ± 6.91522e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [25, 39, 71, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [20, 38, 41, 48, 97, 100, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4190', '1.800', '0.1836', '1.800', '0.0892', '7.000', '0.7069', 1, 1, 1, 1, 1725543051.2523127]
VI_after__Init : ['1.202', '0.4191', '1.800', '0.1836', '1.800', '0.0838', '7.000', '0.7070', 1, 1, 1, 1, 1725543059.4337254]
VI_at__the_End : ['1.202', '0.5086', '1.800', '0.1408', '1.800', '0.1093', '7.000', '0.7077', 1, 1, 1, 1, 1725543125.3551693]