TEST_NAME : Wafer
TEST_DATE : 24_09_05-15_32_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-014-014-01 | FUSED_ID : 6359364768394961121
  IC_TEMP :  -51.86 | VDDM : 1391.90 | AUX_INT :  -91.90 | CsaBias :  -91.90
  CONF_FAIL_REG : 2656
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.04102e-02 / 2
  ADC_P0  : -9.18976e-02 ± 2.90027e-01
  ADC_P1  : 9.79118e-03 ± 7.31964e-03
  ADC_P2  : -1.07453e-05 ± 3.36156e-05
  CSA_Chi2/NDF : 3.48494e-04 / 2
  CSA_P0  : 5.95154e-02 ± 1.24514e-02
  CSA_P1  : 5.84439e-03 ± 9.38127e-04
  CSA_P2  : 1.09422e-06 ± 1.42866e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [22, 34, 38, 53, 58, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [8, 18, 19, 27, 36, 41, 42, 74, 92, 119, 120, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3288', '1.800', '0.1682', '1.791', '0.1500', '7.000', '0.7079', 1, 1, 1, 1, 1725543147.673558]
VI_after__Init : ['1.202', '0.3289', '1.800', '0.1739', '1.795', '0.1501', '7.000', '0.7069', 1, 1, 1, 1, 1725543155.8518915]
VI_at__the_End : ['1.202', '0.4298', '1.800', '0.1710', '1.783', '0.1501', '7.000', '0.7079', 1, 1, 1, 1, 1725543214.7428772]