TEST_NAME : Wafer
TEST_DATE : 24_09_05-15_35_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-014-016-06 | FUSED_ID : 6359364768394961158
  IC_TEMP :  -48.15 | VDDM : 1125.95 | AUX_INT :   -8.07 | CsaBias :   82.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31859e-03 / 2
  ADC_P0  : -8.06582e-03 ± 2.45778e-02
  ADC_P1  : 8.29624e-03 ± 5.89187e-04
  ADC_P2  : -6.05506e-06 ± 2.80333e-06
  CSA_Chi2/NDF : 8.93627e-05 / 2
  CSA_P0  : 5.86246e-02 ± 6.30523e-03
  CSA_P1  : 9.70355e-03 ± 4.75053e-04
  CSA_P2  : -4.24848e-05 ± 7.23450e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [41, 74]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [6, 7, 45, 47, 66, 96, 97, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1056', '1.800', '0.1820', '1.800', '0.0839', '7.000', '0.7071', 1, 1, 1, 1, 1725543341.0688186]
VI_after__Init : ['1.202', '0.1056', '1.800', '0.1820', '1.800', '0.0778', '7.000', '0.7070', 1, 1, 1, 1, 1725543349.2071621]
VI_at__the_End : ['1.202', '0.4985', '1.800', '0.1394', '1.799', '0.1100', '7.000', '0.7075', 1, 1, 1, 1, 1725543412.9005334]