TEST_NAME : Wafer
TEST_DATE : 24_09_05-15_38_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-014-018-06 | FUSED_ID : 6359364768394961190
  IC_TEMP :  -50.31 | VDDM : 1132.87 | AUX_INT :   -5.03 | CsaBias :   77.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.15038e-04 / 2
  ADC_P0  : -5.03177e-03 ± 1.81169e-02
  ADC_P1  : 8.31978e-03 ± 4.55922e-04
  ADC_P2  : -4.89182e-06 ± 2.27137e-06
  CSA_Chi2/NDF : 1.12828e-04 / 2
  CSA_P0  : 6.00531e-02 ± 7.08486e-03
  CSA_P1  : 1.00347e-02 ± 5.33793e-04
  CSA_P2  : -4.59785e-05 ± 8.12904e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [42, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [8, 43, 52, 65, 87, 102, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1830', '1.800', '0.1299', '1.799', '0.0828', '7.000', '0.7069', 1, 1, 1, 1, 1725543534.712803]
VI_after__Init : ['1.202', '0.1831', '1.800', '0.1299', '1.800', '0.0779', '7.000', '0.7067', 1, 1, 1, 1, 1725543542.7670803]
VI_at__the_End : ['1.202', '0.5026', '1.800', '0.1395', '1.807', '0.1110', '7.000', '0.7076', 1, 1, 1, 1, 1725543604.2695143]