TEST_NAME : Wafer
TEST_DATE : 24_09_05-15_40_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-014-019-06 | FUSED_ID : 6359364768394961206
  IC_TEMP :  410.98 | VDDM : -107.96 | AUX_INT : -107.96 | CsaBias : -107.96
  CONF_FAIL_REG : 1034
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.91401e-01 / 2
  ADC_P0  : 6.56841e+00 ± 1.60044e+07
  ADC_P1  : -1.67640e-02 ± 3.22356e+05
  ADC_P2  : -4.45910e-04 ± 1.61988e+03
  CSA_Chi2/NDF : 9.89221e-05 / 2
  CSA_P0  : 2.24051e-02 ± 6.63390e-03
  CSA_P1  : 9.50025e-03 ± 4.99817e-04
  CSA_P2  : -4.74203e-05 ± 7.61162e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [2, 30, 36, 74, 80, 98, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [54, 67, 79, 94, 108, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1796', '1.800', '0.1927', '1.800', '0.0854', '7.000', '0.7069', 1, 1, 1, 1, 1725543631.8034806]
VI_after__Init : ['1.202', '0.1795', '1.800', '0.1926', '1.800', '0.0801', '7.000', '0.7070', 1, 1, 1, 1, 1725543639.9288452]
VI_at__the_End : ['1.202', '0.4290', '1.800', '0.1714', '1.800', '0.0938', '7.000', '0.7074', 1, 1, 1, 1, 1725543698.9156036]