TEST_NAME : Wafer
TEST_DATE : 24_09_05-15_47_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-014-023-06 | FUSED_ID : 6359364768394961270
  IC_TEMP :  -46.23 | VDDM : 1127.77 | AUX_INT :  -25.92 | CsaBias :   67.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.69067e-03 / 2
  ADC_P0  : -2.59153e-02 ± 2.88737e-02
  ADC_P1  : 8.55687e-03 ± 6.94371e-04
  ADC_P2  : -6.64344e-06 ± 3.30533e-06
  CSA_Chi2/NDF : 7.24695e-05 / 2
  CSA_P0  : 5.85003e-02 ± 5.67806e-03
  CSA_P1  : 9.58548e-03 ± 4.27801e-04
  CSA_P2  : -3.86459e-05 ± 6.51490e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [3, 11, 24, 33, 37, 59, 87, 111, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [37, 40, 105, 110, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4757', '1.800', '0.1406', '1.800', '0.0949', '7.000', '0.7069', 1, 1, 1, 1, 1725544020.0963929]
VI_after__Init : ['1.202', '0.4760', '1.800', '0.1406', '1.800', '0.0891', '7.000', '0.7065', 1, 1, 1, 1, 1725544028.2328444]
VI_at__the_End : ['1.202', '0.5060', '1.800', '0.1363', '1.801', '0.1076', '7.000', '0.7074', 1, 1, 1, 1, 1725544090.7290912]