TEST_NAME : Wafer
TEST_DATE : 24_09_05-16_25_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-015-005-12 | FUSED_ID : 6359364768394965084
  IC_TEMP :  -51.10 | VDDM : 1127.78 | AUX_INT :   -6.55 | CsaBias :   86.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21940e-03 / 2
  ADC_P0  : -6.54897e-03 ± 2.36879e-02
  ADC_P1  : 8.49424e-03 ± 5.98217e-04
  ADC_P2  : -5.60703e-06 ± 2.99152e-06
  CSA_Chi2/NDF : 1.23373e-04 / 2
  CSA_P0  : 5.84852e-02 ± 7.40854e-03
  CSA_P1  : 9.98401e-03 ± 5.58180e-04
  CSA_P2  : -4.50659e-05 ± 8.50042e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [13, 35, 62, 72, 76, 86, 93, 98, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [3, 9, 25, 31, 36, 56, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3835', '1.800', '0.1434', '1.800', '0.0917', '7.000', '0.7070', 1, 1, 1, 1, 1725546340.169332]
VI_after__Init : ['1.202', '0.3836', '1.801', '0.1436', '1.801', '0.0860', '7.000', '0.7069', 1, 1, 1, 1, 1725546348.26161]
VI_at__the_End : ['1.202', '0.5047', '1.800', '0.1362', '1.802', '0.1087', '7.000', '0.7079', 1, 1, 1, 1, 1725546409.382893]