TEST_NAME : Wafer
TEST_DATE : 24_09_05-16_20_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-015-008-12 | FUSED_ID : 6359364768394965132
  IC_TEMP :  -49.51 | VDDM : 1142.39 | AUX_INT :   -6.06 | CsaBias :   76.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.79466e-04 / 2
  ADC_P0  : -6.05916e-03 ± 1.89095e-02
  ADC_P1  : 8.34825e-03 ± 4.74242e-04
  ADC_P2  : -5.21495e-06 ± 2.34914e-06
  CSA_Chi2/NDF : 1.15204e-04 / 2
  CSA_P0  : 5.80692e-02 ± 7.15907e-03
  CSA_P1  : 9.81388e-03 ± 5.39384e-04
  CSA_P2  : -4.30760e-05 ± 8.21418e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [2, 3, 9, 15, 23, 29, 50, 62]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [14, 15, 23, 57, 87, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1028', '1.800', '0.1774', '1.800', '0.0862', '7.000', '0.7072', 1, 1, 1, 1, 1725546050.1918662]
VI_after__Init : ['1.202', '0.1029', '1.800', '0.1773', '1.800', '0.0803', '7.000', '0.7071', 1, 1, 1, 1, 1725546058.2542272]
VI_at__the_End : ['1.202', '0.5015', '1.800', '0.1380', '1.802', '0.1095', '7.000', '0.7079', 1, 1, 1, 1, 1725546125.3899872]