TEST_NAME : Wafer
TEST_DATE : 24_09_05-16_17_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-015-010-12 | FUSED_ID : 6359364768394965164
  IC_TEMP :  -49.08 | VDDM : 1134.75 | AUX_INT :   -5.64 | CsaBias :   74.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.63101e-04 / 2
  ADC_P0  : -5.64176e-03 ± 1.99203e-02
  ADC_P1  : 8.06601e-03 ± 4.85175e-04
  ADC_P2  : -4.57195e-06 ± 2.34266e-06
  CSA_Chi2/NDF : 1.26499e-04 / 2
  CSA_P0  : 6.02033e-02 ± 7.50181e-03
  CSA_P1  : 1.01617e-02 ± 5.65207e-04
  CSA_P2  : -4.72970e-05 ± 8.60743e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [74, 80, 83, 111, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [31, 41, 50, 90, 118, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4256', '1.800', '0.1501', '1.800', '0.0932', '7.000', '0.7074', 1, 1, 1, 1, 1725545856.408927]
VI_after__Init : ['1.202', '0.4257', '1.800', '0.1501', '1.800', '0.0873', '7.000', '0.7075', 1, 1, 1, 1, 1725545864.449221]
VI_at__the_End : ['1.202', '0.5091', '1.800', '0.1391', '1.803', '0.1097', '7.000', '0.7081', 1, 1, 1, 1, 1725545924.6665862]