TEST_NAME : Wafer
TEST_DATE : 24_09_05-16_14_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-015-012-12 | FUSED_ID : 6359364768394965196
  IC_TEMP :  -47.92 | VDDM : 1130.05 | AUX_INT :   -6.20 | CsaBias :   87.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01524e-03 / 2
  ADC_P0  : -6.20290e-03 ± 2.16207e-02
  ADC_P1  : 7.82698e-03 ± 5.10180e-04
  ADC_P2  : -4.28116e-06 ± 2.38980e-06
  CSA_Chi2/NDF : 1.04929e-04 / 2
  CSA_P0  : 6.03906e-02 ± 6.83235e-03
  CSA_P1  : 9.72439e-03 ± 5.14768e-04
  CSA_P2  : -4.18815e-05 ± 7.83931e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [17, 20, 32, 66, 97, 100, 107, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [27, 78, 88, 91, 92]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2217', '1.800', '0.1424', '1.800', '0.0839', '7.000', '0.7078', 1, 1, 1, 1, 1725545663.413123]
VI_after__Init : ['1.202', '0.2217', '1.800', '0.1424', '1.800', '0.0782', '7.000', '0.7077', 1, 1, 1, 1, 1725545671.4555075]
VI_at__the_End : ['1.202', '0.5039', '1.800', '0.1370', '1.801', '0.1100', '7.000', '0.7083', 1, 1, 1, 1, 1725545732.2936172]