TEST_NAME : Wafer
TEST_DATE : 24_09_05-16_11_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-015-014-12 | FUSED_ID : 6359364768394965228
  IC_TEMP :  -44.31 | VDDM : 1129.45 | AUX_INT :   -7.98 | CsaBias :   96.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15032e-03 / 2
  ADC_P0  : -7.98451e-03 ± 2.29823e-02
  ADC_P1  : 8.08046e-03 ± 5.45720e-04
  ADC_P2  : -5.32286e-06 ± 2.56935e-06
  CSA_Chi2/NDF : 8.51989e-05 / 2
  CSA_P0  : 5.88497e-02 ± 6.15658e-03
  CSA_P1  : 9.52458e-03 ± 4.63854e-04
  CSA_P2  : -3.89324e-05 ± 7.06394e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [18, 89, 103, 113, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [20, 21, 31, 45, 65, 81, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3669', '1.800', '0.1361', '1.800', '0.0870', '7.000', '0.7078', 1, 1, 1, 1, 1725545469.8344684]
VI_after__Init : ['1.202', '0.3669', '1.800', '0.1360', '1.800', '0.0814', '7.000', '0.7076', 1, 1, 1, 1, 1725545477.9566424]
VI_at__the_End : ['1.202', '0.5011', '1.800', '0.1355', '1.807', '0.1083', '7.000', '0.7085', 1, 1, 1, 1, 1725545539.3339398]