TEST_NAME : Wafer
TEST_DATE : 24_09_05-16_09_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-015-015-12 | FUSED_ID : 6359364768394965244
  IC_TEMP :  -50.74 | VDDM : 1128.04 | AUX_INT :   -6.71 | CsaBias :   50.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.10441e-04 / 2
  ADC_P0  : -6.70527e-03 ± 1.79863e-02
  ADC_P1  : 8.28376e-03 ± 4.31896e-04
  ADC_P2  : -6.21198e-06 ± 2.04709e-06
  CSA_Chi2/NDF : 1.18081e-04 / 2
  CSA_P0  : 5.78839e-02 ± 7.24790e-03
  CSA_P1  : 1.00721e-02 ± 5.46077e-04
  CSA_P2  : -4.59797e-05 ± 8.31610e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [0, 17, 31, 54, 59, 77]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [17, 20, 30, 98, 108, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4492', '1.800', '0.1561', '1.800', '0.0929', '7.000', '0.7079', 1, 1, 1, 1, 1725545372.9951713]
VI_after__Init : ['1.202', '0.4494', '1.800', '0.1561', '1.800', '0.0872', '7.000', '0.7077', 1, 1, 1, 1, 1725545381.0224898]
VI_at__the_End : ['1.202', '0.5038', '1.800', '0.1387', '1.800', '0.1099', '7.000', '0.7086', 1, 1, 1, 1, 1725545450.4830437]