TEST_NAME : Wafer
TEST_DATE : 24_09_05-16_07_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-015-016-11 | FUSED_ID : 6359364768394965259
  IC_TEMP :  -53.22 | VDDM : 1134.10 | AUX_INT :   -5.88 | CsaBias :   84.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.33789e-04 / 2
  ADC_P0  : -5.88028e-03 ± 1.95359e-02
  ADC_P1  : 8.23464e-03 ± 4.77276e-04
  ADC_P2  : -5.40378e-06 ± 2.30603e-06
  CSA_Chi2/NDF : 1.23481e-04 / 2
  CSA_P0  : 5.93014e-02 ± 7.41178e-03
  CSA_P1  : 1.01863e-02 ± 5.58424e-04
  CSA_P2  : -4.93885e-05 ± 8.50414e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [18, 70]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [26, 36, 51, 77, 87, 107, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2701', '1.800', '0.1567', '1.799', '0.0915', '7.000', '0.7081', 1, 1, 1, 1, 1725545275.7479444]
VI_after__Init : ['1.202', '0.2702', '1.800', '0.1566', '1.800', '0.0859', '7.000', '0.7078', 1, 1, 1, 1, 1725545283.7603185]
VI_at__the_End : ['1.202', '0.5022', '1.800', '0.1381', '1.800', '0.1110', '6.999', '0.7085', 1, 1, 1, 1, 1725545352.2108393]