TEST_NAME : Wafer
TEST_DATE : 24_09_05-15_59_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-015-021-11 | FUSED_ID : 6359364768394965339
  IC_TEMP :  -52.43 | VDDM : 1114.13 | AUX_INT :   -6.52 | CsaBias :   76.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00677e-03 / 2
  ADC_P0  : -6.52201e-03 ± 2.14832e-02
  ADC_P1  : 8.31826e-03 ± 5.26625e-04
  ADC_P2  : -5.64838e-06 ± 2.55622e-06
  CSA_Chi2/NDF : 1.13937e-04 / 2
  CSA_P0  : 6.27967e-02 ± 7.11957e-03
  CSA_P1  : 1.02614e-02 ± 5.36408e-04
  CSA_P2  : -4.79738e-05 ± 8.16886e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [25, 120, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [0, 11, 45, 70, 85, 110, 113, 116, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1369', '1.800', '0.1204', '1.799', '0.0870', '7.000', '0.7072', 1, 1, 1, 1, 1725544792.5856485]
VI_after__Init : ['1.202', '0.1369', '1.800', '0.1203', '1.800', '0.0815', '7.000', '0.7074', 1, 1, 1, 1, 1725544800.5142066]
VI_at__the_End : ['1.202', '0.5131', '1.800', '0.1396', '1.803', '0.1105', '7.000', '0.7083', 1, 1, 1, 1, 1725544865.475188]