TEST_NAME : Wafer
TEST_DATE : 24_09_05-15_58_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x5 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-015-022-11 | FUSED_ID : 6359364768394965355
  IC_TEMP :  -47.53 | VDDM : 1126.57 | AUX_INT :  -62.03 | CsaBias :   34.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58858e-03 / 2
  ADC_P0  : -6.20297e-02 ± 3.00049e-02
  ADC_P1  : 8.85522e-03 ± 6.94091e-04
  ADC_P2  : -7.92290e-06 ± 3.17441e-06
  CSA_Chi2/NDF : 9.22777e-05 / 2
  CSA_P0  : 5.87997e-02 ± 6.40724e-03
  CSA_P1  : 9.84355e-03 ± 4.82739e-04
  CSA_P2  : -4.28469e-05 ± 7.35155e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [68, 79, 92, 99, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [22, 38, 59, 64, 70, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3162', '1.800', '0.1400', '1.800', '0.0842', '7.000', '0.7073', 1, 1, 1, 1, 1725544695.1832137]
VI_after__Init : ['1.202', '0.3162', '1.800', '0.1399', '1.802', '0.0789', '7.000', '0.7075', 1, 1, 1, 1, 1725544703.2586122]
VI_at__the_End : ['1.202', '0.5052', '1.800', '0.1362', '1.808', '0.1092', '7.000', '0.7080', 1, 1, 1, 1, 1725544766.7376652]