TEST_NAME : Wafer
TEST_DATE : 24_09_05-15_55_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-015-024-11 | FUSED_ID : 6359364768394965387
  IC_TEMP :  -51.63 | VDDM : 1147.08 | AUX_INT : -202.80 | CsaBias :  -53.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 4.32652e-04 / 2
  ADC_P0  : -2.02796e-01 ± 1.99724e-02
  ADC_P1  : 1.08956e-02 ± 4.33975e-04
  ADC_P2  : -1.53681e-05 ± 1.84624e-06
  CSA_Chi2/NDF : 9.27651e-05 / 2
  CSA_P0  : 5.80932e-02 ± 6.42414e-03
  CSA_P1  : 9.45109e-03 ± 4.84012e-04
  CSA_P2  : -3.68979e-05 ± 7.37093e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [59, 78, 79, 88, 93, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [24, 25, 33, 38, 86, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3477', '1.800', '0.1284', '1.799', '0.0875', '7.000', '0.7074', 1, 1, 1, 1, 1725544502.2929277]
VI_after__Init : ['1.202', '0.3477', '1.800', '0.1284', '1.801', '0.0831', '7.000', '0.7070', 1, 1, 1, 1, 1725544510.3233457]
VI_at__the_End : ['1.202', '0.5036', '1.800', '0.1359', '1.803', '0.1090', '7.000', '0.7080', 1, 1, 1, 1, 1725544573.150422]