TEST_NAME : Wafer
TEST_DATE : 24_09_05-16_32_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-016-008-04 | FUSED_ID : 6359364768394969220
  IC_TEMP :  -52.53 | VDDM : 1125.80 | AUX_INT :   -8.23 | CsaBias :   83.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10552e-03 / 2
  ADC_P0  : -8.22623e-03 ± 2.24951e-02
  ADC_P1  : 8.37606e-03 ± 5.48462e-04
  ADC_P2  : -6.02195e-06 ± 2.64988e-06
  CSA_Chi2/NDF : 1.36344e-04 / 2
  CSA_P0  : 5.94619e-02 ± 7.78827e-03
  CSA_P1  : 1.00026e-02 ± 5.86790e-04
  CSA_P2  : -4.62106e-05 ± 8.93611e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [6, 45, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [36, 59, 69, 72, 73, 78, 80, 90, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2048', '1.800', '0.1420', '1.800', '0.0824', '7.000', '0.7072', 1, 1, 1, 1, 1725546726.681222]
VI_after__Init : ['1.202', '0.2049', '1.800', '0.1419', '1.800', '0.0765', '7.000', '0.7069', 1, 1, 1, 1, 1725546735.4405797]
VI_at__the_End : ['1.202', '0.4997', '1.800', '0.1380', '1.803', '0.1098', '7.000', '0.7077', 1, 1, 1, 1, 1725546801.3725312]