TEST_NAME : Wafer
TEST_DATE : 24_09_05-16_35_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-016-010-04 | FUSED_ID : 6359364768394969252
  IC_TEMP :  -45.56 | VDDM : 1112.51 | AUX_INT :   -7.19 | CsaBias :   91.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.52267e-04 / 2
  ADC_P0  : -7.19171e-03 ± 2.09159e-02
  ADC_P1  : 8.26496e-03 ± 5.17211e-04
  ADC_P2  : -5.03499e-06 ± 2.53643e-06
  CSA_Chi2/NDF : 1.33136e-04 / 2
  CSA_P0  : 5.86830e-02 ± 7.69609e-03
  CSA_P1  : 1.01200e-02 ± 5.79845e-04
  CSA_P2  : -4.50929e-05 ± 8.83036e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [2, 8, 13, 62, 67, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [9, 27, 30, 61, 62, 100, 106, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1485', '1.800', '0.1665', '1.799', '0.0811', '7.000', '0.7068', 1, 1, 1, 1, 1725546920.4772522]
VI_after__Init : ['1.202', '0.1485', '1.800', '0.1665', '1.800', '0.0756', '7.000', '0.7067', 1, 1, 1, 1, 1725546928.6526148]
VI_at__the_End : ['1.202', '0.5140', '1.800', '0.1412', '1.804', '0.1073', '7.000', '0.7076', 1, 1, 1, 1, 1725546988.0809195]