TEST_NAME : Wafer
TEST_DATE : 24_09_05-16_38_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-016-012-04 | FUSED_ID : 6359364768394969284
  IC_TEMP :  -49.06 | VDDM : 1123.92 | AUX_INT :   -8.23 | CsaBias :   79.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.12025e-03 / 2
  ADC_P0  : -8.23319e-03 ± 2.26936e-02
  ADC_P1  : 8.05218e-03 ± 5.42304e-04
  ADC_P2  : -4.82559e-06 ± 2.58125e-06
  CSA_Chi2/NDF : 1.10519e-04 / 2
  CSA_P0  : 6.01669e-02 ± 7.01197e-03
  CSA_P1  : 9.87270e-03 ± 5.28301e-04
  CSA_P2  : -4.33461e-05 ± 8.04541e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [24, 55, 68, 78, 103, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [7, 50, 60, 62, 79, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2338', '1.800', '0.1744', '1.799', '0.0899', '7.000', '0.7066', 1, 1, 1, 1, 1725547114.599148]
VI_after__Init : ['1.202', '0.2337', '1.800', '0.1743', '1.801', '0.0844', '7.000', '0.7069', 1, 1, 1, 1, 1725547122.6576385]
VI_at__the_End : ['1.201', '0.5064', '1.800', '0.1394', '1.802', '0.1100', '7.000', '0.7073', 1, 1, 1, 1, 1725547182.948423]