TEST_NAME : Wafer
TEST_DATE : 24_09_05-16_49_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-016-019-03 | FUSED_ID : 6359364768394969395
  IC_TEMP :  -47.48 | VDDM : 1130.84 | AUX_INT :   -6.51 | CsaBias :   81.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11407e-03 / 2
  ADC_P0  : -6.51133e-03 ± 2.26337e-02
  ADC_P1  : 8.01979e-03 ± 5.40255e-04
  ADC_P2  : -4.93960e-06 ± 2.55507e-06
  CSA_Chi2/NDF : 8.95061e-05 / 2
  CSA_P0  : 5.92293e-02 ± 6.31028e-03
  CSA_P1  : 9.63400e-03 ± 4.75434e-04
  CSA_P2  : -4.02426e-05 ± 7.24030e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [4, 7, 10, 13, 14, 27, 45, 47, 71, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [4, 13, 41, 45, 47, 83, 105, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1998', '1.800', '0.1527', '1.799', '0.0851', '7.000', '0.7072', 1, 1, 1, 1, 1725547784.246818]
VI_after__Init : ['1.202', '0.1998', '1.800', '0.1527', '1.801', '0.0794', '7.000', '0.7070', 1, 1, 1, 1, 1725547792.3851945]
VI_at__the_End : ['1.202', '0.5050', '1.800', '0.1370', '1.804', '0.1085', '7.000', '0.7079', 1, 1, 1, 1, 1725547856.971433]