TEST_NAME : Wafer
TEST_DATE : 24_09_05-17_15_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-017-011-09 | FUSED_ID : 6359364768394973369
  IC_TEMP :  -51.77 | VDDM : 1124.89 | AUX_INT :  -37.96 | CsaBias :   51.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.86666e-03 / 2
  ADC_P0  : -3.79587e-02 ± 3.09514e-02
  ADC_P1  : 8.98866e-03 ± 7.65038e-04
  ADC_P2  : -7.33431e-06 ± 3.76206e-06
  CSA_Chi2/NDF : 1.42361e-04 / 2
  CSA_P0  : 6.12029e-02 ± 7.95826e-03
  CSA_P1  : 1.02082e-02 ± 5.99597e-04
  CSA_P2  : -4.95327e-05 ± 9.13116e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [40, 58, 63, 78]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [25, 29, 44, 67, 82, 89, 90, 104, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2964', '1.800', '0.1337', '1.800', '0.0865', '7.000', '0.7070', 1, 1, 1, 1, 1725549318.4057975]
VI_after__Init : ['1.202', '0.2965', '1.800', '0.1338', '1.800', '0.0814', '7.000', '0.7070', 1, 1, 1, 1, 1725549326.519197]
VI_at__the_End : ['1.202', '0.5035', '1.800', '0.1436', '1.800', '0.1132', '7.000', '0.7082', 1, 1, 1, 1, 1725549385.2656446]