TEST_NAME : Wafer
TEST_DATE : 24_09_05-17_13_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-017-012-09 | FUSED_ID : 6359364768394973385
  IC_TEMP :  -49.93 | VDDM : 1113.98 | AUX_INT :   -6.42 | CsaBias :   77.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.77514e-04 / 2
  ADC_P0  : -6.42179e-03 ± 1.88713e-02
  ADC_P1  : 8.40305e-03 ± 4.70690e-04
  ADC_P2  : -5.62667e-06 ± 2.32066e-06
  CSA_Chi2/NDF : 1.42092e-04 / 2
  CSA_P0  : 5.96974e-02 ± 7.95073e-03
  CSA_P1  : 9.94988e-03 ± 5.99030e-04
  CSA_P2  : -4.45542e-05 ± 9.12252e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  23
 | N_BROKEN_FAST :  [2, 10, 11, 19, 26, 39, 47, 57, 64, 70, 71, 86, 90, 93, 100, 101, 105, 120]
 | N_BROKEN_SLOW :  [20, 57, 61, 93, 110]
   P_BROKEN_DISC :  38
 | P_BROKEN_FAST :  [2, 15, 22, 25, 28, 32, 37, 44, 52, 59, 72, 86, 95, 97, 112, 113, 123]
 | P_BROKEN_SLOW :  [5, 9, 13, 20, 25, 27, 45, 53, 57, 61, 65, 69, 71, 89, 93, 97, 99, 101, 110, 117, 121]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3697', '1.800', '0.1899', '1.800', '0.0877', '7.000', '0.7072', 1, 1, 1, 1, 1725549220.990373]
VI_after__Init : ['1.202', '0.3694', '1.800', '0.1897', '1.801', '0.0820', '7.000', '0.7073', 1, 1, 1, 1, 1725549229.7577274]
VI_at__the_End : ['1.202', '0.5110', '1.800', '0.1399', '1.804', '0.1108', '7.000', '0.7078', 1, 1, 1, 1, 1725549295.4836164]