TEST_NAME : Wafer
TEST_DATE : 24_09_05-17_12_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-017-013-09 | FUSED_ID : 6359364768394973401
  IC_TEMP :  -47.78 | VDDM : 1122.40 | AUX_INT :   -6.73 | CsaBias :   89.90
  CONF_FAIL_REG : 226
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03063e-03 / 2
  ADC_P0  : -6.72679e-03 ± 2.18001e-02
  ADC_P1  : 8.10528e-03 ± 5.35596e-04
  ADC_P2  : -4.45285e-06 ± 2.61006e-06
  CSA_Chi2/NDF : 1.10878e-03 / 2
  CSA_P0  : 6.94636e-02 ± 2.22098e-02
  CSA_P1  : 8.22723e-03 ± 1.67335e-03
  CSA_P2  : -2.49634e-05 ± 2.54831e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [53, 57, 71, 87, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [0, 4, 9, 14, 26, 54, 81]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2501', '1.800', '0.1678', '1.799', '0.0810', '7.000', '0.7074', 1, 1, 1, 1, 1725549124.0719962]
VI_after__Init : ['1.202', '0.2501', '1.800', '0.1673', '1.802', '0.0754', '7.000', '0.7072', 1, 1, 1, 1, 1725549132.9291072]
VI_at__the_End : ['1.202', '0.4996', '1.800', '0.1375', '1.799', '0.1111', '7.000', '0.7081', 1, 1, 1, 1, 1725549194.6314454]