TEST_NAME : Wafer
TEST_DATE : 24_09_05-17_10_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-017-014-09 | FUSED_ID : 6359364768394973417
  IC_TEMP :  -49.65 | VDDM : 1122.94 | AUX_INT :   -8.37 | CsaBias :   82.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10097e-03 / 2
  ADC_P0  : -8.37016e-03 ± 2.24558e-02
  ADC_P1  : 8.36294e-03 ± 5.49267e-04
  ADC_P2  : -5.76690e-06 ± 2.66856e-06
  CSA_Chi2/NDF : 9.86309e-05 / 2
  CSA_P0  : 6.14430e-02 ± 6.62413e-03
  CSA_P1  : 9.67494e-03 ± 4.99080e-04
  CSA_P2  : -3.95777e-05 ± 7.60040e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [1, 20, 41, 55, 64, 85, 98, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [10, 33, 46, 54, 98, 122, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3579', '1.800', '0.1527', '1.799', '0.0982', '7.000', '0.7082', 1, 1, 1, 1, 1725549028.5630777]
VI_after__Init : ['1.202', '0.3580', '1.800', '0.1527', '1.801', '0.0908', '7.000', '0.7076', 1, 1, 1, 1, 1725549036.6854875]
VI_at__the_End : ['1.202', '0.5096', '1.800', '0.1401', '1.804', '0.1096', '7.000', '0.7083', 1, 1, 1, 1, 1725549095.4620552]