TEST_NAME : Wafer
TEST_DATE : 24_09_05-17_05_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-017-017-14 | FUSED_ID : 6359364768394973470
  IC_TEMP :  -42.78 | VDDM : 1126.14 | AUX_INT :   -8.92 | CsaBias :   85.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.51706e-03 / 2
  ADC_P0  : -8.91764e-03 ± 2.64747e-02
  ADC_P1  : 7.95817e-03 ± 6.30836e-04
  ADC_P2  : -4.37284e-06 ± 2.99807e-06
  CSA_Chi2/NDF : 7.99165e-05 / 2
  CSA_P0  : 5.97818e-02 ± 5.96267e-03
  CSA_P1  : 9.66289e-03 ± 4.49244e-04
  CSA_P2  : -3.94292e-05 ± 6.84145e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [1, 11, 54, 62, 81, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [5, 28, 99, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3211', '1.800', '0.1489', '1.800', '0.0908', '7.000', '0.7078', 1, 1, 1, 1, 1725548737.0183063]
VI_after__Init : ['1.201', '0.3211', '1.800', '0.1490', '1.800', '0.0851', '7.000', '0.7077', 1, 1, 1, 1, 1725548745.9785826]
VI_at__the_End : ['1.202', '0.5070', '1.800', '0.1399', '1.800', '0.1090', '7.000', '0.7085', 1, 1, 1, 1, 1725548813.735471]