TEST_NAME : Wafer
TEST_DATE : 24_09_05-17_04_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-017-018-14 | FUSED_ID : 6359364768394973486
  IC_TEMP :  -48.46 | VDDM : 1129.02 | AUX_INT :  -17.55 | CsaBias :   70.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.79605e-03 / 2
  ADC_P0  : -1.75475e-02 ± 2.93260e-02
  ADC_P1  : 8.06643e-03 ± 6.93057e-04
  ADC_P2  : -4.86260e-06 ± 3.26084e-06
  CSA_Chi2/NDF : 9.61136e-05 / 2
  CSA_P0  : 5.84816e-02 ± 6.53905e-03
  CSA_P1  : 9.86029e-03 ± 4.92670e-04
  CSA_P2  : -4.34918e-05 ± 7.50279e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2100', '1.800', '0.0896', '1.808', '0.0911', '7.000', '0.7086', 1, 1, 1, 1, 1725548640.4995892]
VI_after__Init : ['1.202', '0.2103', '1.800', '0.0896', '1.800', '0.0838', '7.000', '0.7078', 1, 1, 1, 1, 1725548648.744956]
VI_at__the_End : ['1.202', '0.5021', '1.800', '0.1353', '1.804', '0.1104', '7.000', '0.7084', 1, 1, 1, 1, 1725548716.2938762]