TEST_NAME : Wafer
TEST_DATE : 24_09_05-17_24_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-018-010-07 | FUSED_ID : 6359364768394977447
  IC_TEMP :  -49.67 | VDDM : 1133.53 | AUX_INT :   -5.55 | CsaBias :   62.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.41973e-04 / 2
  ADC_P0  : -5.55405e-03 ± 1.96447e-02
  ADC_P1  : 8.53161e-03 ± 5.00452e-04
  ADC_P2  : -5.64246e-06 ± 2.51881e-06
  CSA_Chi2/NDF : 1.06917e-04 / 2
  CSA_P0  : 5.97498e-02 ± 6.89678e-03
  CSA_P1  : 9.61946e-03 ± 5.19623e-04
  CSA_P2  : -3.90895e-05 ± 7.91324e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [41, 92, 94, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [8, 37, 40, 52, 75, 96, 98, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1360', '1.800', '0.1567', '1.800', '0.0883', '7.000', '0.7070', 1, 1, 1, 1, 1725549897.687085]
VI_after__Init : ['1.202', '0.1361', '1.800', '0.1567', '1.801', '0.0824', '7.000', '0.7068', 1, 1, 1, 1, 1725549905.7694564]
VI_at__the_End : ['1.202', '0.5069', '1.800', '0.1412', '1.800', '0.1102', '7.000', '0.7079', 1, 1, 1, 1, 1725549968.283764]