TEST_NAME : Wafer
TEST_DATE : 24_09_05-17_28_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-018-012-07 | FUSED_ID : 6359364768394977479
  IC_TEMP :  -49.92 | VDDM : 1114.29 | AUX_INT :   -8.65 | CsaBias :   83.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.50660e-03 / 2
  ADC_P0  : -8.64526e-03 ± 2.63402e-02
  ADC_P1  : 8.43369e-03 ± 6.53668e-04
  ADC_P2  : -5.71840e-06 ± 3.21756e-06
  CSA_Chi2/NDF : 1.23663e-04 / 2
  CSA_P0  : 5.97269e-02 ± 7.41724e-03
  CSA_P1  : 9.79998e-03 ± 5.58835e-04
  CSA_P2  : -4.16036e-05 ± 8.51040e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [13, 63, 81, 85, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [7, 58, 68, 78, 88, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1626', '1.800', '0.1405', '1.800', '0.0866', '7.000', '0.7068', 1, 1, 1, 1, 1725550090.2203708]
VI_after__Init : ['1.202', '0.1625', '1.800', '0.1405', '1.799', '0.0811', '7.000', '0.7069', 1, 1, 1, 1, 1725550098.252846]
VI_at__the_End : ['1.202', '0.5101', '1.800', '0.1383', '1.800', '0.1107', '7.000', '0.7076', 1, 1, 1, 1, 1725550163.7277763]