TEST_NAME : Wafer
TEST_DATE : 24_09_05-17_36_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-021-018-017-00 | FUSED_ID : 6359364768394977552
  IC_TEMP :  -48.79 | VDDM : 1142.06 | AUX_INT : -201.33 | CsaBias :  -67.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 4.01888e-04 / 2
  ADC_P0  : -2.01331e-01 ± 1.93029e-02
  ADC_P1  : 1.13588e-02 ± 4.44336e-04
  ADC_P2  : -1.63059e-05 ± 2.00502e-06
  CSA_Chi2/NDF : 1.32258e-04 / 2
  CSA_P0  : 5.91880e-02 ± 7.67066e-03
  CSA_P1  : 1.01700e-02 ± 5.77929e-04
  CSA_P2  : -4.55144e-05 ± 8.80117e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [6, 18, 25, 37, 48, 75, 106, 111, 113, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0666', '1.800', '0.0990', '1.800', '0.0753', '7.000', '0.7075', 1, 1, 1, 1, 1725550567.085936]
VI_after__Init : ['1.202', '0.0665', '1.800', '0.0990', '1.801', '0.0678', '7.000', '0.7067', 1, 1, 1, 1, 1725550575.937177]
VI_at__the_End : ['1.202', '0.5133', '1.800', '0.1391', '1.801', '0.1093', '7.000', '0.7076', 1, 1, 1, 1, 1725550639.3733463]