TEST_NAME : Wafer
TEST_DATE : 24_09_05-17_40_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.1
  ASIC_ID : XA-000-09-004-021-018-020-00 | FUSED_ID : 6359364768394977600
  IC_TEMP : -528.73 | VDDM : 1771.46 | AUX_INT : 1771.46 | CsaBias : 1771.46
  CONF_FAIL_REG : 4367
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 0.00000e+00 / 2
  ADC_P0  : -6.93119e-03 ± 2.22995e-02
  ADC_P1  : 8.09906e-03 ± 5.47867e-04
  ADC_P2  : -4.41165e-06 ± 2.66985e-06
  CSA_Chi2/NDF : 9.20485e-09 / 2
  CSA_P0  : 2.34472e-01 ± 6.39927e-05
  CSA_P1  : 5.95981e-06 ± 4.82139e-06
  CSA_P2  : -5.40337e-08 ± 7.34241e-08
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [22, 39, 83, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [2, 5, 23, 26, 30, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2345', '1.800', '0.1585', '1.800', '0.0962', '7.000', '0.7079', 1, 1, 1, 1, 1725550857.2328334]
VI_after__Init : ['1.202', '0.2345', '1.800', '0.1585', '1.800', '0.0879', '7.000', '0.7069', 1, 1, 1, 1, 1725550865.3070521]
VI_at__the_End : ['1.202', '0.2345', '1.800', '0.1585', '1.800', '0.0926', '7.000', '0.7081', 1, 1, 1, 1, 1725550923.3376646]