TEST_NAME : Wafer
TEST_DATE : 24_09_11-15_33_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-002-010-07 | FUSED_ID : 6359364768398057639
  IC_TEMP :  -89.38 | VDDM : 1111.36 | AUX_INT :  -12.53 | CsaBias :   42.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.33738e-03 / 2
  ADC_P0  : -1.25337e-02 ± 3.27644e-02
  ADC_P1  : 9.24013e-03 ± 8.51568e-04
  ADC_P2  : -7.94194e-06 ± 4.42804e-06
  CSA_Chi2/NDF : 1.91889e-04 / 2
  CSA_P0  : 5.66863e-02 ± 9.23949e-03
  CSA_P1  : 1.02589e-02 ± 6.96129e-04
  CSA_P2  : -6.40797e-05 ± 1.06012e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [25, 40, 95, 96, 117, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [2, 20, 56, 57, 58, 62, 65, 81, 84, 106, 109, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2609', '1.800', '0.1481', '1.800', '0.1011', '7.000', '0.7087', 1, 1, 1, 1, 1726061582.0401964]
VI_after__Init : ['1.201', '0.2612', '1.800', '0.1483', '1.800', '0.0935', '7.000', '0.7079', 1, 1, 1, 1, 1726061590.7094831]
VI_at__the_End : ['1.201', '0.4417', '1.800', '0.1353', '1.804', '0.1238', '7.000', '0.7086', 1, 1, 1, 1, 1726061644.4563124]