TEST_NAME : Wafer
TEST_DATE : 24_09_11-15_34_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-002-011-07 | FUSED_ID : 6359364768398057655
  IC_TEMP :  -67.82 | VDDM : 1117.36 | AUX_INT :   -9.68 | CsaBias :   83.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.77901e-03 / 2
  ADC_P0  : -9.67830e-03 ± 2.86528e-02
  ADC_P1  : 8.50504e-03 ± 7.15907e-04
  ADC_P2  : -5.70150e-06 ± 3.56086e-06
  CSA_Chi2/NDF : 2.11222e-04 / 2
  CSA_P0  : 5.69983e-02 ± 9.69375e-03
  CSA_P1  : 1.01546e-02 ± 7.30354e-04
  CSA_P2  : -5.49679e-05 ± 1.11224e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [12, 51, 52, 76, 81, 99, 103, 108, 109, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [0, 2, 5, 77, 87]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3361', '1.800', '0.1250', '1.799', '0.0979', '7.000', '0.7088', 1, 1, 1, 1, 1726061679.1817653]
VI_after__Init : ['1.201', '0.3362', '1.800', '0.1249', '1.801', '0.0903', '7.000', '0.7081', 1, 1, 1, 1, 1726061687.3061574]
VI_at__the_End : ['1.201', '0.4728', '1.800', '0.1362', '1.800', '0.1221', '7.000', '0.7090', 1, 1, 1, 1, 1726061758.4296098]