TEST_NAME : Wafer
TEST_DATE : 24_09_11-15_45_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-002-018-00 | FUSED_ID : 6359364768398057760
  IC_TEMP :  -58.26 | VDDM : 1121.78 | AUX_INT :   -7.92 | CsaBias :   75.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23088e-03 / 2
  ADC_P0  : -7.92169e-03 ± 2.37902e-02
  ADC_P1  : 8.35962e-03 ± 5.88344e-04
  ADC_P2  : -5.52172e-06 ± 2.88247e-06
  CSA_Chi2/NDF : 1.79009e-04 / 2
  CSA_P0  : 5.74912e-02 ± 8.92401e-03
  CSA_P1  : 9.80635e-03 ± 6.72360e-04
  CSA_P2  : -4.73673e-05 ± 1.02392e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [2, 16, 64, 72, 81, 88, 93, 100, 108, 113, 115, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [16, 27, 77, 80, 94, 103, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0968', '1.800', '0.1356', '1.800', '0.0858', '7.000', '0.7079', 1, 1, 1, 1, 1726062356.6855352]
VI_after__Init : ['1.202', '0.0968', '1.800', '0.1356', '1.800', '0.0803', '7.000', '0.7081', 1, 1, 1, 1, 1726062364.7569387]
VI_at__the_End : ['1.202', '0.4850', '1.800', '0.1352', '1.799', '0.1179', '7.000', '0.7086', 1, 1, 1, 1, 1726062424.2721612]