TEST_NAME : Wafer
TEST_DATE : 24_09_11-16_08_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-003-010-10 | FUSED_ID : 6359364768398061738
  IC_TEMP :  -59.72 | VDDM : 1115.70 | AUX_INT :   -8.05 | CsaBias :   76.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02955e-03 / 2
  ADC_P0  : -8.04677e-03 ± 2.16513e-02
  ADC_P1  : 8.56308e-03 ± 5.27899e-04
  ADC_P2  : -7.14305e-06 ± 2.53805e-06
  CSA_Chi2/NDF : 1.08645e-04 / 2
  CSA_P0  : 5.79001e-02 ± 6.95227e-03
  CSA_P1  : 9.59004e-03 ± 5.23803e-04
  CSA_P2  : -4.16281e-05 ± 7.97690e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [12, 40, 68, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [2, 3, 15, 22, 45, 61, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2856', '1.800', '0.1902', '1.799', '0.0901', '7.000', '0.7072', 1, 1, 1, 1, 1726063715.9450774]
VI_after__Init : ['1.202', '0.2857', '1.800', '0.1902', '1.800', '0.0843', '7.000', '0.7072', 1, 1, 1, 1, 1726063724.11542]
VI_at__the_End : ['1.202', '0.4932', '1.800', '0.1367', '1.804', '0.1150', '7.000', '0.7079', 1, 1, 1, 1, 1726063791.918128]