TEST_NAME : Wafer
TEST_DATE : 24_09_11-16_05_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-003-012-10 | FUSED_ID : 6359364768398061770
  IC_TEMP :  -60.86 | VDDM : 1126.99 | AUX_INT :   -9.45 | CsaBias :   81.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55130e-03 / 2
  ADC_P0  : -9.44551e-03 ± 2.66982e-02
  ADC_P1  : 8.33732e-03 ± 6.45609e-04
  ADC_P2  : -5.94554e-06 ± 3.10004e-06
  CSA_Chi2/NDF : 1.59784e-04 / 2
  CSA_P0  : 5.70749e-02 ± 8.43119e-03
  CSA_P1  : 9.74040e-03 ± 6.35229e-04
  CSA_P2  : -4.59550e-05 ± 9.67379e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [1, 49, 52, 93, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [67, 69, 87, 93, 116, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2079', '1.800', '0.1704', '1.800', '0.0892', '7.000', '0.7072', 1, 1, 1, 1, 1726063521.0443366]
VI_after__Init : ['1.202', '0.2081', '1.800', '0.1705', '1.801', '0.0836', '7.000', '0.7070', 1, 1, 1, 1, 1726063529.9136078]
VI_at__the_End : ['1.201', '0.4839', '1.800', '0.1351', '1.804', '0.1184', '7.000', '0.7077', 1, 1, 1, 1, 1726063589.597965]