TEST_NAME : Wafer
TEST_DATE : 24_09_11-16_00_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-003-015-10 | FUSED_ID : 6359364768398061818
  IC_TEMP :  -54.87 | VDDM : 1106.20 | AUX_INT :   -9.08 | CsaBias :   81.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34306e-03 / 2
  ADC_P0  : -9.08385e-03 ± 2.48049e-02
  ADC_P1  : 8.30157e-03 ± 5.94630e-04
  ADC_P2  : -6.06364e-06 ± 2.82923e-06
  CSA_Chi2/NDF : 1.19297e-04 / 2
  CSA_P0  : 5.78720e-02 ± 7.28512e-03
  CSA_P1  : 9.42346e-03 ± 5.48882e-04
  CSA_P2  : -4.11744e-05 ± 8.35882e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [10, 14, 84, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [17, 19, 22, 28, 47, 50, 71, 76, 81, 99, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2341', '1.800', '0.1615', '1.800', '0.0870', '7.000', '0.7071', 1, 1, 1, 1, 1726063229.1621792]
VI_after__Init : ['1.202', '0.2342', '1.800', '0.1616', '1.800', '0.0814', '7.000', '0.7072', 1, 1, 1, 1, 1726063237.978461]
VI_at__the_End : ['1.201', '0.4819', '1.800', '0.1341', '1.800', '0.1140', '7.000', '0.7079', 1, 1, 1, 1, 1726063306.625002]