TEST_NAME : Wafer
TEST_DATE : 24_09_11-15_57_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-003-017-13 | FUSED_ID : 6359364768398061853
  IC_TEMP :  -55.89 | VDDM : 1110.25 | AUX_INT :  -10.72 | CsaBias :   67.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.75740e-03 / 2
  ADC_P0  : -1.07226e-02 ± 2.84115e-02
  ADC_P1  : 8.71622e-03 ± 7.12868e-04
  ADC_P2  : -6.47022e-06 ± 3.57140e-06
  CSA_Chi2/NDF : 1.53860e-04 / 2
  CSA_P0  : 5.97343e-02 ± 8.27343e-03
  CSA_P1  : 1.01527e-02 ± 6.23343e-04
  CSA_P2  : -5.01861e-05 ± 9.49278e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [32, 41, 79, 84, 99, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [13, 27, 40, 77]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2607', '1.800', '0.1476', '1.799', '0.0927', '7.000', '0.7074', 1, 1, 1, 1, 1726063034.9604414]
VI_after__Init : ['1.202', '0.2607', '1.800', '0.1475', '1.800', '0.0870', '7.000', '0.7073', 1, 1, 1, 1, 1726063043.7187076]
VI_at__the_End : ['1.201', '0.4965', '1.800', '0.1377', '1.800', '0.1154', '7.000', '0.7081', 1, 1, 1, 1, 1726063109.1275558]