TEST_NAME : Wafer
TEST_DATE : 24_09_11-16_37_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-004-020-05 | FUSED_ID : 6359364768398065989
  IC_TEMP :  -55.48 | VDDM : 1117.97 | AUX_INT :   -8.76 | CsaBias :   73.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26340e-03 / 2
  ADC_P0  : -8.76326e-03 ± 2.40832e-02
  ADC_P1  : 8.24736e-03 ± 5.82247e-04
  ADC_P2  : -5.49091e-06 ± 2.79844e-06
  CSA_Chi2/NDF : 1.30666e-04 / 2
  CSA_P0  : 5.98373e-02 ± 7.62437e-03
  CSA_P1  : 9.60072e-03 ± 5.74441e-04
  CSA_P2  : -4.29766e-05 ± 8.74806e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [7, 41, 66, 68, 74]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [0, 8, 15, 17, 22, 30, 39, 48, 73, 75, 107, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.1949', '1.800', '0.1742', '1.800', '0.0919', '7.000', '0.7090', 1, 1, 1, 1, 1726065460.5259078]
VI_after__Init : ['1.201', '0.1949', '1.800', '0.1739', '1.800', '0.0845', '7.000', '0.7079', 1, 1, 1, 1, 1726065468.6342273]
VI_at__the_End : ['1.201', '0.4875', '1.800', '0.1387', '1.806', '0.1145', '7.000', '0.7085', 1, 1, 1, 1, 1726065535.4070332]